PROBE Datasheet(PDF) - 23027 - Aries Electronics, Inc.

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PROBE Datasheet, PDF

Searched Keyword : 'PROBE' - Total: 8 (1/1) Pages

Manufacturer	Part #	Datasheet	Description
Aries Electronics, Inc.	23027	1Mb/2P	ADG Coating to Lessen/Eliminate Probe Cleaning
	24008	2Mb/2P	High-Frequency Center Probe Test Socket for Devices up to 13mm Square
	24012	1Mb/2P	High-Frequency Center Probe Test Socket for Devices up to 55mm Square
	24013	1Mb/2P	High-Frequency Center Probe Test Socket for Devices up to 6.5mm Square
	24010	1Mb/2P	Machined High-Frequency Center Probe Test Socket for BGA, CSP, & MLF Packages
	24011	2Mb/2P	High-Frequency Center Probe Test Socket for Devices up to 40mm Square
	24009	1Mb/2P	High-Frequency Center Probe Test Socket for Devices up to 27mm Square
	24009-APP	2Mb/2P	High-Frequency Center Probe Test Socket with Adj. Pressure Pad for Devices up to 27mm Sq

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