| Manufacturer | Part # | Datasheet | Description |
Aries Electronics, Inc.
|
10002 |
716Kb/1P |
High-Temp Universal ZIF DIP Burn-in & Test Socket |
| 10002HT |
716Kb/1P |
High-Temp 250째C Universal ZIF DIPBurn-in & Test Socket ??300째C Special Order |
| 24001HT |
533Kb/1P |
High-Temp up to 250째C RF Test Socket with Replaceable Contact Strips |
| 10004HT |
1Mb/2P |
High-Temp PGA ZIF Test & Burn-in Socket for Footprints on Std 8x8 to 21x21 Grid |
| 23026 |
803Kb/1P |
Hi-Temp 200째C Test & Burn- In Sockets for BGA, LGA, QFN, MLCC, and Bumped Die Devices |
| 23026HT |
844Kb/1P |
High-Temp 200째C Test & Burn-In Sockets for BGA, LGA, QFN, MLCC, and Bumped Die Devices |
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