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ALL Advanced Power Electronics Corp.(3)Aeroflex Circuit Technology(2)Agere Systems(2)Altera Corporation(1)Analog Devices(1)ATMEL Corporation(1)Broadcom Corporation.(1)California Eastern Labs(6)Cirrus Logic(3)CML Microcircuits(1)Cypress Semiconductor(1)ELM Electronics(1)
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Description : 'TEST' - Total: 181 (1/10) Pages
ManufacturerPart No.DatasheetDescription
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Hirose Electric 		TR0636E-20009 Datasheet pdf image
604Kb / 11P		 IT3 Test Vehicle Assembly Yield Test
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Texas Instruments 		SN54BCT8244A_08 Datasheet pdf image
642Kb / 28P		 SCAN TEST DEVICES WITH OCTAL BUFFERS
SN54LVTH18514 Datasheet pdf image
548Kb / 34P		 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
Company Logo Img
Cypress Semiconductor 		CY3631 Datasheet pdf image
68Kb / 2P		 WirelessUSB(TM) Manufacturing Test Kit
Company Logo Img
Texas Instruments 		SN54ABT8245_08 Datasheet pdf image
665Kb / 30P		 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN54ABT18245A_06 Datasheet pdf image
436Kb / 32P		 SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS
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Silicon Laboratories 		C10881 Datasheet pdf image
265Kb / 3P		 BOARD INSERTION FORCE: 16 OZ MAX PER CONTACT PAIR WHEN USING A .062 TEST BLADE
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Maxim Integrated Produc... 		MAX4135_97 Datasheet pdf image
120Kb / 4P		 RF-style connectors (SMA) and 75Ω terminating resistors are included for video test to order free samples
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Texas Instruments 		SN54BCT8240A Datasheet pdf image
473Kb / 26P		 SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS
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Integrated Device Techn... 		IDTSSTE32882HLBAKG Datasheet pdf image
1Mb / 73P		 1.35V/1.5V REGISTERING CLOCK DRIVER WITH PARITY TEST AND QUAD CHIP SELECT
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Agilent(Hewlett-Packard... 		W2641A Datasheet pdf image
666Kb / 8P		 DisplayPort Test Point Access Adapter
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Texas Instruments 		SN54ABT8646 Datasheet pdf image
537Kb / 32P		 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND RESISTERS
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Advanced Power Electron... 		AP03N70I Datasheet pdf image
69Kb / 4P		 100% Avalanche Test, Fast Switching, Simple Drive Requirement
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Integrated Device Techn... 		IDT74SSTU32866B Datasheet pdf image
258Kb / 19P		 1.8V CONFIGURABLE BUFFER WITH ADDRESSPARITY TEST
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Texas Instruments 		SN54ABT18646 Datasheet pdf image
414Kb / 29P		 SCAN TEST DEVICE WITH 18-BIT TRANSCEIVERS AND REGISTERS
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Intersil Corporation 		ISLA212P50_1105 Datasheet pdf image
1Mb / 38P		 12-Bit, 500MSPS ADC Programmable Built-in Test Patterns
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Agilent(Hewlett-Packard... 		E1962B Datasheet pdf image
879Kb / 26P		 cdma2000/IS-95/AMPS Mobile Test Application
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National Semiconductor ... 		SCANPSC110F Datasheet pdf image
459Kb / 29P		 SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support)
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Texas Instruments 		SN74SSTUB32866_09 Datasheet pdf image
1Mb / 38P		 25-BIT CONFIGURABLE REGISTERED BUFFER WITH ADDRESS-PARITY TEST
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California Eastern Labs 		GET-30497 Datasheet pdf image
889Kb / 24P		 Qualification Test Results on Si MMIC

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